Microelectronic Manufacturing Yield, Reliability and Failure Analysis: 25-26 October 1995, Austin, Texas (Proceedings of Spie--The International Society for Optical Engineering, V. 2635.)

by Gopal K. Rao and Society of Photo-optical Instrumentation Engineers

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• Format: Paperback
• Language: English
• ISBN: 0819420018
• ISBN13: 9780819420015
• Release Date: January 1
• Publisher: Society of Photo Optical
• Weight: 1.50 lbs.
• Dimensions: 10.8" x 0.8" x 8.5"