Measurement Techniques for Radio Frequency Nanoelectronics

by T. Mitch Wallis and Pavel Kabos

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. - Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides - Gain practical insights into instrumentation, including...

• Format: Hardcover
• Language: English
• ISBN: 1107120683
• ISBN13: 9781107120686
• Release Date: October 2017
• Publisher: Cambridge University Press
• Length: 328 Pages
• Weight: 1.78 lbs.
• Dimensions: 0.8" x 7.2" x 10.2"