Matching Properties of Deep Sub-Micron Mos Transistors

by Willy Sansen, Jeroen A. Croon, Herman E. Maes, et al.

Book Overview

Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermore, due to the down-scaling of device dimensions, transistor mismatch has an increasing impact on digital circuits. The matching properties...

• Format: Paperback
• Language: English
• ISBN: 1441937188
• ISBN13: 9781441937186
• Release Date: December 2010
• Publisher: Springer
• Length: 206 Pages
• Weight: 0.69 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"