Matching Properties of Deep Sub-Micron Mos Transistors

by Willy Sansen, Jeroen A. Croon, Herman E. Maes, et al.

Book Overview

Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermore, due to the down-scaling of device dimensions, transistor mismatch has an increasing impact on digital circuits. The matching properties...

• Format: Hardcover
• Language: English
• ISBN: 0387243143
• ISBN13: 9780387243146
• Release Date: March 2005
• Publisher: Springer
• Length: 206 Pages
• Weight: 1.05 lbs.
• Dimensions: 0.6" x 6.3" x 9.4"