Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization

by Mehdi Tahoori, Zeyu Sun, Sheldon Tan, et al.

Book Overview

This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system...

• Format: Paperback
• Language: English
• ISBN: 3030261743
• ISBN13: 9783030261740
• Release Date: September 2020
• Publisher: Springer
• Length: 460 Pages
• Weight: 1.54 lbs.
• Dimensions: 1.0" x 6.1" x 9.2"