Learning from VLSI Design Experience

by Weng Fook Lee

This book shares with readers practical design knowledge gained from the author's 24 years of IC design experience. The author addresses issues and challenges faced commonly by IC designers, along with solutions and workarounds. Guidelines are described for tackling issues such as clock domain crossing, using lockup latch to cross clock domains during scan shift, implementation of scan chains across power domain, optimization methods to improve...

• Format: Hardcover
• Language: English
• ISBN: 303003237X
• ISBN13: 9783030032371
• Release Date: February 2019
• Publisher: Springer
• Length: 214 Pages
• Weight: 1.15 lbs.
• Dimensions: 0.6" x 6.1" x 9.2"