Journey to Data Quality

by Yang W. Lee, Richard Y. Wang, James D. Funk, et al.

Book Overview

'Journey to Data Quality' is a guide for assessing an organization's data quality practice and a roadmap for implementing a viable data and information quality management program, based on research and drawing on real-world examples.

• Format: Hardcover
• Language: English
• ISBN: 0262122871
• ISBN13: 9780262122870
• Release Date: January 2006
• Publisher: MIT Press (MA)
• Length: 226 Pages
• Weight: 1.00 lbs.
• Dimensions: 0.7" x 6.3" x 9.1"