Introduction to Scanning Tunneling Microscopy Third Edition

by Julian Chen and C. Julian Chen

The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. Since the publication of its first edition, this book has been the standard...

• Format: Hardcover
• Language: English
• ISBN: 0198856555
• ISBN13: 9780198856559
• Release Date: May 2021
• Publisher: Oxford University Press
• Length: 496 Pages
• Weight: 2.20 lbs.
• Dimensions: 0.9" x 5.9" x 9.3"