Introduction to Advanced System-On-Chip Test Design and Optimization

by Erik Larsson

Book Overview

Testing Concepts.- Design Flow.- Design for Test.- Boundary Scan.- SOC Design for Testability.- System Modeling.- Test Conflicts.- Test Power Dissipation.- Test Access Mechanism.- Test Scheduling.- SOC Test Applications.- A Reconfigurable Power-Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling.- An Integrated Framework for the Design and Optimization of SOC Test Solutions.- Efficient Test Solutions for Core-Based Designs.-...

• Format: Paperback
• Language: English
• ISBN: 1441952691
• ISBN13: 9781441952691
• Release Date: February 2011
• Publisher: Springer
• Length: 388 Pages
• Weight: 1.26 lbs.
• Dimensions: 0.8" x 6.1" x 9.2"