Intermittent Failures in Integrated Circuits: Detection, Characterization and Fault Tolerance

by Alodeep Sanyal, Sandip Kundu, Ilia Polian

This book presents a consolidated study of the entire class of intermittent failures by analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault tolerant design techniques at various layers of abstraction (from transistor to architecture) to improve reliability of system operation in presence of intermittent errors.

• Format: Hardcover
• Language: English
• ISBN: 1441983147
• ISBN13: 9781441983145
• Release Date: January 2016
• Publisher: Springer
• Length: 300 Pages