Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach

by Edward B Hakim, Michael G Pecht, Pradeep Lall, et al.

This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at realistic steady state temperatures without reliability penalties. Higher temperature performance than is commonly recommended is shown to be cost effective...

• Format: Paperback
• Language: English
• ISBN: 0367400979
• ISBN13: 9780367400972
• Release Date: June 2019
• Publisher: CRC Press
• Length: 336 Pages
• Weight: 1.70 lbs.
• Dimensions: 0.6" x 7.0" x 9.9"