Iddq Testing of VLSI Circuits

by Ravi K. Gulati

Book Overview

Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0792393155
• ISBN13: 9780792393153
• Release Date: December 1992
• Publisher: Springer
• Length: 124 Pages
• Weight: 0.15 lbs.
• Dimensions: 0.4" x 7.0" x 10.0"