Hot-Carrier Reliability of Mos VLSI Circuits

by Sung-Mo Kang, Yusuf Leblebici, Sung-Mo (Steve) Kang

Book Overview

As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1461364299
• ISBN13: 9781461364290
• Release Date: September 2012
• Publisher: Springer
• Length: 212 Pages
• Weight: 0.74 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"