Hot-Carrier Reliability of Mos VLSI Circuits

by Sung-Mo Kang, Yusuf Leblebici, Sung-Mo (Steve) Kang

Book Overview

As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be based on both the failure mode analysis and the basic understanding of the physical failure mechanisms observed in integrated circuits. Hot-carrier induced degrada- tion of MOS transistor characteristics...

• Format: Paperback
• Language: English
• ISBN: 1461364299
• ISBN13: 9781461364290
• Release Date: September 2012
• Publisher: Springer
• Length: 212 Pages
• Weight: 0.74 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"