High Resolution X-Ray Diffractometry And Topography

by D. Keith Bowen, Brian K Tanner, B.K. Tanner, et al.

Book Overview

The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography...

• Format: Paperback
• Language: English
• ISBN: 0367400634
• ISBN13: 9780367400637
• Release Date: October 2019
• Publisher: CRC Press
• Length: 264 Pages
• Weight: 0.95 lbs.
• Dimensions: 0.7" x 6.8" x 9.5"