High Quality Test Pattern Generation and Boolean Satisfiability

by Rolf Drechsler and Stephan Eggersglüß

Part I: Preliminaries and Previous Work.- Circuits and Testing.- Boolean Satisfiability.- ATPG Based on Boolean Satisfiability.- Part II: New SAT Techniques and their Application in ATPG.- Dynamic Clause Activation.- Circuit-based Dynamic Learning.- Part III: High Quality Delay Test Generation.- High Quality ATPG for Transition Faults.- Path Delay Fault Model.- Summary and Outlook.

• Format: Paperback
• Language: English
• ISBN: 1489988475
• ISBN13: 9781489988478
• Release Date: October 2014
• Publisher: Springer
• Length: 193 Pages
• Weight: 0.67 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"