Helium Ion Microscopy: Principles and Applications

by David C. Joy

Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1461486599
• ISBN13: 9781461486596
• Release Date: September 2013
• Publisher: Springer
• Length: 64 Pages
• Weight: 0.35 lbs.
• Dimensions: 0.3" x 5.9" x 8.9"