Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

by Patrick Echlin

Book Overview

Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive...

• Format: Hardcover
• Language: English
• ISBN: 0387857303
• ISBN13: 9780387857305
• Release Date: March 2009
• Publisher: Springer
• Length: 332 Pages
• Weight: 2.05 lbs.
• Dimensions: 1.0" x 7.3" x 10.1"