Fundamentals of Nanoscale Film Analysis

by Terry L. Alford, L.C. Feldman, James W. Mayer

Book Overview

An Overview: Concepts, Units, and the Bohr Atom.- Atomic Collisions and Backscattering Spectrometry.- Energy Loss of Light Ions and Backscattering Depth Profiles.- Sputter Depth Profiles and Secondary Ion Mass Spectroscopy.- Ion Channeling.- Electron-Electron Interactions and the Depth Sensitivity of Electron Spectroscopies.- X-ray Diffraction.- Electron Diffraction.- Photon Absorption in Solids and EXAFS.- X-ray Photoelectron Spectroscopy.- Radiative...

• Format: Paperback
• Language: English
• ISBN: 1441939806
• ISBN13: 9781441939807
• Release Date: October 2010
• Publisher: Springer
• Length: 336 Pages
• Weight: 1.09 lbs.
• Dimensions: 0.7" x 6.1" x 9.2"