Fundamentals of Electromigration-Aware Integrated Circuit Design

by Jens Lienig and Matthias Thiele

Book Overview

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 3319735578
• ISBN13: 9783319735573
• Release Date: March 2018
• Publisher: Springer
• Length: 159 Pages
• Weight: 0.94 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"