Skip to content
Scan a barcode
Scan

Fractography in Failure Analysis: a Symposium Presented at May Committee Week, American Society for Testing and Materials, 1-6 May 1977, Toronto

No Synopsis Available.

Recommended

Format: Hardcover

Temporarily Unavailable

We receive fewer than 1 copy every 6 months.

Customer Reviews

0 rating
Copyright © 2025 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks ® and the ThriftBooks ® logo are registered trademarks of Thrift Books Global, LLC
GoDaddy Verified and Secured