Focused Beam Methods: Measuring Microwave Materials in Free Space

by John W. Schultz

Determining the intrinsic microwave properties of materials is important for a variety of applications ranging from antenna and electronic circuit design to remote sensing to electromagnetic... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1480092851
• ISBN13: 9781480092853
• Release Date: October 2012
• Publisher: Createspace Independent Publishing Platform
• Length: 142 Pages
• Weight: 0.85 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"