Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories

by Kanad Chakraborty and Pinaki Mazumder

All modern electronic systems have memory. Most often that memory is RAM, or random access memory. This text covers research topics in circuit and processing technologies, as relevant to RAM... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0130084654
• ISBN13: 9780130084651
• Release Date: January 2002
• Publisher: Prentice Hall PTR
• Length: 426 Pages
• Weight: 1.85 lbs.
• Dimensions: 0.9" x 7.2" x 9.5"