Failure-Free Integrated Circuit Packages: Systematic Elimination of Failures Through Reliability Engineering, Failure Analysis, and Material Improveme

by Charles A. Harper, Charles Harper, Charles Cohn

Driven by the fast-growing market for personal electronic devices, integrated circuit complexity has increased as feature sizes shrink. The resulting integrated circuit devices are prone to more... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0071434844
• ISBN13: 9780071434843
• Release Date: July 2004
• Publisher: McGraw-Hill Companies
• Length: 363 Pages
• Weight: 1.55 lbs.
• Dimensions: 1.2" x 6.3" x 9.1"