Failure-Free Integrated Circuit Packages: Systematic Elimination of Failures Through Reliability Engineering, Failure Analysis, and Material Improveme

by Charles A. Harper, Charles Harper, Charles Cohn

Driven by the fast-growing market for personal electronic devices, integrated circuit complexity has increased as feature sizes shrink. The resulting integrated circuit devices are prone to more frequent failures, which must be found, identified, and fixed. This unique reference uses graphic illustrations to clearly identify all major failure mode types, allowing engineers to spot failures before they occur.

• Format: Hardcover
• Language: English
• ISBN: 0071434844
• ISBN13: 9780071434843
• Release Date: July 2004
• Publisher: McGraw-Hill Companies
• Length: 363 Pages
• Weight: 1.55 lbs.
• Dimensions: 1.2" x 6.3" x 9.1"