Evaluation of Advanced Semiconductor Materials by Electron Microscopy

by David Cherns and David Cherns

The last few years have een rapid improvements in semiconductor growth techniques which have produced an expanding range of high quality heterostructures for new semiconductor devises. As the dimensions of such structures approach the nanometer level, it becomes increasingly important to characterise materials properties such as composition uniformity, strain, interface sharpness and roughness and the nature of defects, as well as their influence...

• Format: Paperback
• Language: English
• ISBN: 1461278503
• ISBN13: 9781461278504
• Release Date: October 2011
• Publisher: Springer
• Length: 412 Pages
• Weight: 1.50 lbs.
• Dimensions: 0.9" x 6.7" x 9.6"