Esd Protection Device and Circuit Design for Advanced CMOS Technologies

by Hossein Sarbishaei, Oleg Semenov, Manoj Sachdev

Book Overview

Dedication. Preface. Acknowledgments. 1. INTRODUCTION. 1. Nature of ESD phenOmena. 2. ESD failures in nanometric technologies. 3. Circuit reliability: ESD models. 4. ESD challenges for advanced CMOS technologies. 5. ESD design window. 6. Book objective and organization. 7. Summary. 2. ESD MODELS AND TEST METHODS. 1. Introduction. 2. ESD zapping modes. 3. HBM model. 4. MM model. 5. CDM model. 6. CBM model. 7. TLP testing. 8. Correlation of ESD test...

• Format: Paperback
• Language: English
• ISBN: 9048178363
• ISBN13: 9789048178360
• Release Date: October 2010
• Publisher: Springer
• Length: 228 Pages
• Weight: 0.78 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"