Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films

by Charles A. Evans Jr., Shaun Wilson, C. Richard Brundle

This text is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This volume describes the techniques used in... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0750691689
• ISBN13: 9780750691680
• Release Date: September 1992
• Publisher: Butterworth-Heinemann
• Length: 800 Pages
• Weight: 2.65 lbs.
• Dimensions: 1.6" x 6.4" x 9.6"