Ellipsometry and Polarized Light

by R.M.A. Azzam, N.M. Bashara, Nicolas M. Bashara

Book Overview

Ellipsometry is a unique optical technique of great sensitivity for in situ non-destructive characterization of surface (inter-facial) phenomena (reactions) utilizing the change in the state of... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 0444870164
• ISBN13: 9780444870162
• Release Date: August 1988
• Publisher: North-Holland
• Length: 558 Pages
• Weight: 1.70 lbs.