Electrothermal Analysis of VLSI Systems

by Ching-Han Tsai, Yi-Kan Cheng, Chin-Chi Teng, et al.

Book Overview

This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.

• Format: Hardcover
• Language: English
• ISBN: 079237861X
• ISBN13: 9780792378617
• Release Date: June 2000
• Publisher: Springer
• Length: 210 Pages
• Weight: 1.15 lbs.
• Dimensions: 0.6" x 6.1" x 9.2"