Electron Nano-Imaging: Basics of Imaging and Diffraction for Tem and Stem

by Nobuo Tanaka

In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details. This book explains the basis of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM)...

• Format: Hardcover
• Language: English
• ISBN: 4431569391
• ISBN13: 9784431569398
• Release Date: August 2024
• Publisher: Springer
• Length: 384 Pages
• Weight: 1.85 lbs.
• Dimensions: 1.0" x 6.3" x 9.6"