Electromigration Modeling at Circuit Layout Level

by Feifei He and Cher Ming Tan

CHAPTER 1 Introduction

1.1 Overview of Electromigration

1.2 Modeling of Electromigration

1.3 Organization of the Book

1.4 Summary

CHAPTER 2 3D Circuit Model Construction and Simulation

2.1 Introduction

2.2 Layout Extraction and 3D Model Construction

2.3 Transient Electro-thermo-structural Simulations and Atomic Flux Divergence (AFD) Computation

2.4 Simulation...

• Format: Paperback
• Language: English
• ISBN: 9814451207
• ISBN13: 9789814451208
• Release Date: May 2013
• Publisher: Springer
• Length: 103 Pages
• Weight: 0.38 lbs.
• Dimensions: 0.2" x 6.1" x 9.2"