Electrical Characterization of Silicon-On-Insulator Materials and Devices

by Sheng Li and Sorin Cristoloveanu

Book Overview

Electrical Characterization of Silicon-on-Insulator Materials and Devices describes a wide variety of electrical characterization methods, from wafer screening and defect identification to detailed... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0792395484
• ISBN13: 9780792395485
• Release Date: June 1995
• Publisher: Springer
• Length: 381 Pages
• Weight: 1.62 lbs.
• Dimensions: 0.9" x 6.1" x 9.2"