Digital System Verification: A Combined Formal Methods and Simulation Framework

by Mitchell A. Thornton, Lun Li, Mitchell Thornton

Integrated circuit capacity follows Moore's law, and chips are commonly produced at the time of this writing with over 70 million gates per device. Ensuring correct functional behavior of such large... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 160845178X
• ISBN13: 9781608451784
• Release Date: February 2010
• Publisher: Morgan & Claypool
• Length: 100 Pages
• Weight: 0.41 lbs.
• Dimensions: 0.2" x 7.5" x 9.3"