Digital Noise Monitoring of Defect Origin

by Telman Aliev

Book Overview

Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features.- Position-Binary Technology of Monitoring Defect at its Origin.- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin.- Robust Correlation Monitoring of a Defect at its Origin.- Spectral Monitoring of a Defect's Origin.- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier.- The Technology...

• Format: Paperback
• Language: English
• ISBN: 1441944109
• ISBN13: 9781441944108
• Release Date: November 2010
• Publisher: Springer
• Length: 224 Pages
• Weight: 0.74 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"