Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms

by Joel Plawsky, Juan Pablo Borja, Toh-Ming Lu

This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the area of dielectric failure, and advanced simulations/models to resolve and predict dielectric breakdown, all of which are of considerable importance for...

• Format: Paperback
• Language: English
• ISBN: 3319432184
• ISBN13: 9783319432182
• Release Date: September 2016
• Publisher: Springer
• Length: 105 Pages
• Weight: 0.38 lbs.
• Dimensions: 0.2" x 6.1" x 9.2"