DFT+Dfd: An Integrated Method for Design for Testability and Diagnosis

By Dr. Michael Hsiao and Nikhil Rahagude

While conventional test point insertions commonly used in design for testability can improve fault coverage, the test points selected may not necessarily be the best candidates to aid silicon... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3843388016
• ISBN13: 9783843388016
• Release Date: February 2011
• Publisher: LAP Lambert Academic Publishing
• Length: 96 Pages
• Weight: 0.33 lbs.
• Dimensions: 0.2" x 6.0" x 9.0"