Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques

by Rolf Drechsler and Sebastian Huhn

Book Overview

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as...

• Format: Paperback
• Language: English
• ISBN: 3030692116
• ISBN13: 9783030692117
• Release Date: April 2022
• Publisher: Springer
• Length: 164 Pages
• Weight: 0.60 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"