Design for Manufacturability and Yield for Nano-Scale CMOS

by Jamil Kawa and Charles C. Chiang

Book Overview

Manufacturability and yield are no longer a fabrication, packaging, and test concerns. They are aspects that have to be designed in, and they are everybody's responsibility. Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the layout of standard cells and how to yield-grade...

• Format: Hardcover
• Language: English
• ISBN: 1402051875
• ISBN13: 9781402051876
• Release Date: July 2007
• Publisher: Springer
• Length: 255 Pages
• Weight: 1.50 lbs.
• Dimensions: 0.7" x 6.5" x 9.4"