Design, Analysis and Test of Logic Circuits Under Uncertainty

by John P. Hayes, Igor L. Markov, Smita Krishnaswamy

Book Overview

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis...

• Format: Paperback
• Language: English
• ISBN: 9400797982
• ISBN13: 9789400797987
• Release Date: October 2014
• Publisher: Springer
• Length: 124 Pages
• Weight: 0.44 lbs.
• Dimensions: 0.3" x 6.1" x 9.2"