Delay Fault Testing for VLSI Circuits

by Angela Krstic and Kwang-Ting (Tim) Cheng

Book Overview

In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly.... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1461375614
• ISBN13: 9781461375616
• Release Date: October 2012
• Publisher: Springer
• Length: 191 Pages
• Weight: 0.66 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"