Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

by José Pineda de Gyvez and Manoj Sachdev

Book Overview

This book is essential to understand new test methodologies, algorithms and industrial practices. Without its insight into the physics of nano-metric technologies, it would be difficult to develop system-level test strategies that yield a high IC fault coverage. The work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies...

• Format: Hardcover
• Language: English
• ISBN: 0387465464
• ISBN13: 9780387465463
• Release Date: June 2007
• Publisher: Springer
• Length: 328 Pages
• Weight: 1.59 lbs.
• Dimensions: 0.7" x 6.4" x 9.3"