Defect Oriented Testing for CMOS Analog and Digital Circuits

by Manoj Sachdev

Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality, and many factors have contributed to their industrial acceptance.... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0792380835
• ISBN13: 9780792380832
• Release Date: December 1997
• Publisher: Kluwer Academic Publishers
• Length: 308 Pages