Defect and Microstructure Analysis by Diffraction

by Robert L. Snyder, Jaroslav Fiala, Hans J. Bunge

Defect and Microstructure Analysis by Diffraction looks at a key aspect of state-of-the-art methods for analyzing the actual structure of materials. Diffraction analysis is typically based on idealized crystals. The impurities and irregularities that work themselves into virtually all crystal structures, however, cause diffraction peak profiles to broaden and sometimes become asymmetric, making the data difficult to interpret. More powerful methods...

• Format: Hardcover
• Language: English
• ISBN: 0198501897
• ISBN13: 9780198501893
• Release Date: March 2000
• Publisher: Intl Union of Crystallography
• Length: 808 Pages
• Weight: 2.86 lbs.
• Dimensions: 1.7" x 6.1" x 9.2"