Debug Automation from Pre-Silicon to Post-Silicon

by Görschwin Fey and Mehdi Dehbashi

Book Overview

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization...

• Format: Hardcover
• Language: English
• ISBN: 3319093088
• ISBN13: 9783319093086
• Release Date: October 2014
• Publisher: Springer
• Length: 171 Pages
• Weight: 0.97 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"