Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics

by Robert Brayton, Sunil Khatri, Alberto Sangiovanni-Vincentelli, et al.

This book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems like cross-talk, electromigration, self-heat, etc. are becoming important. Cross-talk is one of the major problems since it results in unpredictable design behavior. In particular, it can result in significant delay variation or signal integrity problems in a wire, depending...

• Format: Hardcover
• Language: English
• ISBN: 079237407X
• ISBN13: 9780792374077
• Release Date: June 2001
• Publisher: Springer
• Length: 112 Pages
• Weight: 0.77 lbs.
• Dimensions: 0.5" x 6.9" x 9.1"