CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test

by Manoj Sachdev and Andrei Pavlov

Book Overview

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and...

• Format: Paperback
• Language: English
• ISBN: 904817855X
• ISBN13: 9789048178551
• Release Date: October 2010
• Publisher: Springer
• Length: 194 Pages
• Weight: 0.67 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"