CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms

by Flora Li and Arokia Nathan

Overview of CCD.- CCD Imaging in the Ultraviolet (UV) Regime.- Silicon.- Silicon Dioxide.- Si-SiO2 Interface.- General Effects of Radiation.- Effects of Radiation on CCDs.- UV-Induced Effects in Si.- UV Laser Induced Effects in SiO2.- UV Laser Induced Effects at the Si-SiO2 Interface.- CCD Measurements at 157nm.- Design Optimizations for Future Research.- Concluding Remarks.

• Format: Paperback
• Language: English
• ISBN: 3642061524
• ISBN13: 9783642061523
• Release Date: October 2010
• Publisher: Springer
• Length: 232 Pages
• Weight: 0.76 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"