Built in Test for VLSI: Pseudorandom Techniques

by Paul H. Bardell, J. Savir, W. H. McAnney

This handbook provides ready access to all of the major concepts, techniques, problems and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. The main intention of this book is to present the material in a unified manner, making...

• Format: Hardcover
• Language: English
• ISBN: 0471624632
• ISBN13: 9780471624639
• Release Date: October 1987
• Publisher: Wiley-Interscience
• Length: 368 Pages
• Weight: 1.60 lbs.
• Dimensions: 0.9" x 6.4" x 9.6"

Customer Reviews

Great Digital test book

This is a great book written from professionals in the materia. I personally took the class with Dr. Savir and he is not only a great professor but this book is well worth purchasing.

BEST TEST BOOK

This is the best test book I have read. It covers all aspects of BIST with emphasis on pseudorandom techniques. It does not cover as much about testing as "Digital System Testing and Testable Design" but it is well worth its price tag.