Built-In-Self-Test and Digital Self-Calibration for RF Socs

by Sleiman Bou-Sleiman and Mohammed Ismail

This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).

• Format: Paperback
• Language: English
• ISBN: 1441995471
• ISBN13: 9781441995476
• Release Date: September 2011
• Publisher: Springer
• Length: 89 Pages
• Weight: 0.36 lbs.
• Dimensions: 0.2" x 6.1" x 9.2"