Atomic Scale Characterization and First-Principles Studies of Si₃n₄ Interfaces

by Weronika Walkosz

Book Overview

This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β-Si3N4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF). These interfaces are of a great fundamental and technological interest because they...

• Format: Paperback
• Language: English
• ISBN: 1461428572
• ISBN13: 9781461428572
• Release Date: May 2013
• Publisher: Springer
• Length: 110 Pages
• Weight: 0.41 lbs.
• Dimensions: 0.3" x 6.1" x 9.2"