Atomic Force Microscopy/Scanning Tunneling Microscopy

by Samuel H. Cohen

The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0306448904
• ISBN13: 9780306448904
• Release Date: March 1995
• Publisher: Springer
• Length: 454 Pages
• Weight: 1.76 lbs.
• Dimensions: 1.2" x 6.9" x 9.1"